Memory and Cell Library Characterization and Simulation Tools
MSIM (spice) and Turbo-MSIM (fast-spice) simulators are the only transistor level simulators that support Hybrid Modeling using measured data. Hybrid Modeling enables ‘perfect’ device modeling by adjusting the simulator equation models with real ‘measured data’ from laboratory characterization tools, resulting in excellent ROI for our customers.
One of the main benefits of Hybrid Modeling is accurate leakage current analysis in MOSFETs, Diodes or other devices. Additional benefits of Hybrid modeling are the ability to optimize a design for leakage and power resulting in longer battery life and standby-time.
MSIM supports IBIS Model Verification and Simulation (for PC board). MSIM has advanced verification functions built-in enabling the most sophisticated checks possible for diagnosing problems in IBIS models.
MSIM’s Design Manager simulation environment enables users to perform large system simulation easily. Dynamic model support for LCD Panel Simulation allows advanced TFT models with Hybrid modeling capability.
MSIM has customized PRBS Stimulus for compliance tests (DDR3, PCIX, USB …). This gives the ability to test high-speed IC package/PCB simulation. The PRBS Stimulus Generator can be sold standalone to provide a stimulus for other circuit simulators which don’t have those advanced PRBS capabilities. [PRBS=Pseudorandom binary sequence]
CharFlo-Cell!: Automatic Standard Cell/IO Characterization for liberty models allow high throughput, high accuracy and full automation. This Multi-goal BiSection prevents glitches/meta-stability while extracting functions from circuit for original .Lib verification and new .Lib generation
Model Diagnoser: Standard Cell Library QA and Defect Repairing was selected by TSMC for 40nm standard cell library Quality Assurance. Used in diagnosing .Lib model to locate functional violations and glitch/meta-stability violations, it is the industry’s first Model Repairing .Lib tool. It is used to prevent functional violations by automatically adjusting the margins on setup/hold time and minimum pulse width.
CharFlo-Memory! Automatic Memory Characterization Tool of choice for leading-edge 45nm/65nm/90nm memory compilers. It is both Instance-based and Compiler Model characterization based.
CharFlo-Custom!: Macro IP and Custom Memory IP Characterization builds critical-path circuits for general designs by Global-SpiceCut
ADVANCED MODELS FOR TFT DISPLAYS
- TFT/OTFT/OLED Model Extraction from measured data for both general and custom models
- TFT/OTFT/OLED Model Refining based on existing model by measured data for both general and custom model
- Advanced modeling support includes Vth Shifting, Self Heating and Kink effects etc.
- Both OLED electrical models and optical simulation are covered.
